首页> 外国专利> Semiconductor wafer breaking device for e.g. integrated circuit chip, has wedge arranged at lower side of wafer premarked in starting area of break line, and arranged opposite to wafer plane such that pressure is exerted at wedge sides

Semiconductor wafer breaking device for e.g. integrated circuit chip, has wedge arranged at lower side of wafer premarked in starting area of break line, and arranged opposite to wafer plane such that pressure is exerted at wedge sides

机译:半导体晶片破碎装置,例如集成电路芯片,具有楔形物,该楔形物布置在晶片的下侧,在中断线的起始区域中标有标记,并与晶片平面相对布置,从而在楔形物侧施加压力

摘要

The device has a breaking wedge (3) arranged at a lower side of a semiconductor wafer (1) that is aligned to a preset break line. A counter support is supported at a top side of the semiconductor wafer. The semiconductor wafer is premarked in a starting area of the preset break line, and the breaking wedge is suitably arranged opposite to the plane of the semiconductor wafer such that pressure is exerted at sides of the breaking wedge in the starting area of the preset break line, where the starting area is preprocessed by the marking.
机译:该装置具有布置在半导体晶片(1)的下侧的断裂楔(3),该断裂楔对准预设断裂线。在半导体晶片的顶侧支撑有对置支撑。半导体晶片在预设断裂线的起始区域中被预先标记,并且断裂楔被适当地布置为与半导体晶片的平面相对,使得压力被施加在断裂楔的侧面在预设断裂线的起始区域中。 ,其中起始区域已通过标记进行了预处理。

著录项

  • 公开/公告号DE102006015141A1

    专利类型

  • 公开/公告日2007-10-04

    原文格式PDF

  • 申请/专利权人 DYNTEST TECHNOLOGIES GMBH;

    申请/专利号DE20061015141

  • 发明设计人 LINDNER JOERG;

    申请日2006-03-31

  • 分类号H01L21/301;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:21

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