Waste silicon selecting method, involves determining if impurity unit is present in pieces of waste silicon on basis of received spectral data, where pieces that contain impurity unit are selected on basis of determination

摘要

The method involves verifying individual pieces of n-type waste silicon by an energy dispersive X-ray fluorescence analyzer. A determination is made if a certain impurity unit is present in the pieces of waste silicon on a basis of received spectral data. The pieces of waste silicon that contain the impurity unit are selected on the basis of determination. Concentration of the unit is computed based on specific electrical resistance.