Confocal self-interference of - microscope without secondary maxima

摘要

The present invention relates to a confocal self-interference of - microscope. The confocal self-interference of - microscope comprises, inter alia, a first polarizer to polarize the light reflected by a sample or fluorescent light, a first double refracting wave plate by the first polarizer for the separation of the incoming light into two beams along a direction of polarization, a second polarizer to polarize of the two of the first double refracting beams incident wave plate, a second double refracting wave plate for separating the two beams incident from the second polarizer in four beams along the direction of polarization, and a third polarizer to polarize the of the second double refracting wave plate incoming four beams, in addition to elements of a conventional confocal microscope. Optical axes of the first and second double refracting wave plate lie on the same plane, optical axes of the first and second double refracting wave plate, with respect to an optical axis of the entire optical system at a predetermined angle, and spatial self-interference of - periods of the first and second double refracting wave plate differ from one another.