首页> 外国专利> Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section

Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section

机译:探测例如集成电路,其触头位于同轴电缆的外围,并由同轴电缆的接地导体屏蔽,同轴电缆终止于倾斜端子部分

摘要

The probe has a coaxial cable (50) terminated in an oblique terminal section and including an axially extending conductor and a coaxial conductor. A dielectric substrate is affixed to the coaxial cable with one side proximate to the section and another side remote from the section. A set of contact tips (28) is located within the periphery of the coaxial cable, and shielded by a ground conductor of the coaxial cable. A conductive unit connects the former conductor to a contact, where the contact is engagable with a device to be tested.
机译:该探针具有同轴电缆(50),该同轴电缆(50)端接在倾斜的端子部分中,并且包括轴向延伸的导体和同轴导体。介电基片以靠近该部分的一侧和远离该部分的另一侧固定到同轴电缆。一组接触尖端(28)位于同轴电缆的外围内,并被同轴电缆的接地导体屏蔽。导电单元将先前的导体连接到触点,该触点可与要测试的设备接合。

著录项

  • 公开/公告号DE102006026229A1

    专利类型

  • 公开/公告日2006-12-28

    原文格式PDF

  • 申请/专利权人 CASCADE MICROTECH INC.;

    申请/专利号DE20061026229

  • 申请日2006-06-06

  • 分类号G01R31/28;G01R1/067;H01L21/66;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:13

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