Testing device for testing a semiconductor device comprises a section for producing a test pattern, side generators, a selecting section for the generators and a section for feeding a test signal to the semiconductor device

摘要

Testing device comprises a section for producing a test pattern for testing a device, several side generators, a section for selecting which side generator produces each side of a test signal based on a pattern of sides produced during a cycle and a section for feeding a test signal to a tested device. Preferred Features: The selecting section selects the side generators so that the generators produce two or more sides within the cycle. A storage section stores the side generators for producing the last production of a side during the cycle.