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A method in order to achieve a substantially uniform surface potential of an insulating object

机译:一种用于实现绝缘物体的基本均匀的表面电势的方法

摘要

An apparatus effects a uniform surface potential on an insulating specimen in an x-ray photoelectron or a secondary ion emission instrument in which there is positive charging of an irradiation region. An area of the specimen including the irradiation region is flooded with a beam of low energy electrons to neutralize the positive charging, causing negative charging of the flooding area. Positive ions are directed onto the flooding area to neutralize the negative charging. The electron beam has an energy less than about 2 eV and an energy spread less than about 0.5 eV. The ratio of the beam distance to its diameter is less than about 10. The ions have an energy less than 10 eV.
机译:该设备在X射线光电子或二次离子发射仪器中的绝缘样品上产生均匀的表面电势,其中照射区域带正电。包括辐照区域的样品区域被低能电子束淹没,以中和正电荷,使淹没区域带负电荷。正离子被引导到溢流区域以中和负电荷。电子束的能量小于约2eV,并且能量散布小于约0.5eV。束距离与其直径之比小于约10。离子的能量小于10 eV。

著录项

  • 公开/公告号DE69737942T2

    专利类型

  • 公开/公告日2007-11-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE1997637942T

  • 发明设计人

    申请日1997-11-21

  • 分类号G01N23/227;H01J37/02;G01N23/20;

  • 国家 DE

  • 入库时间 2022-08-21 20:27:28

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