首页> 外国专利> METHOD AND APPARATUS FOR MEASURING ELECTROSTATIC LATENT IMAGE, IMAGE FORMING APPARATUS, LATENT IMAGE CARRIER, PROGRAM FOR MEASURING ELECTROSTATIC LATENT IMAGE, AND COMPUTER-READABLE RECORDING MEDIUM

METHOD AND APPARATUS FOR MEASURING ELECTROSTATIC LATENT IMAGE, IMAGE FORMING APPARATUS, LATENT IMAGE CARRIER, PROGRAM FOR MEASURING ELECTROSTATIC LATENT IMAGE, AND COMPUTER-READABLE RECORDING MEDIUM

机译:用于测量静电潜像的方法和装置,图像形成装置,潜像载体,用于测量静电潜像的程序以及计算机可读记录介质

摘要

PROBLEM TO BE SOLVED: To provide a method and apparatus for measuring electrostatic latent images, which adjusts the displayed magnification so as not to generate inconsistencies between the displayed magnification and actual magnification, and to provide an image forming apparatus, a latent image carrier, a program for measuring an electrostatic latent image, and a computer-readable recording medium.;SOLUTION: The apparatus for measuring the electrostatic latent image mainly includes a charged particle gun 11; apertures 12 and 12A; a condenser lens 13; a beam blanker 14; a beam deflection means 15; an objective lens 16; a charged particle beam drive section 31; an exhaust means 33; a computer 40; a semiconductor laser 17 being the first light source; a collimating lens 18; an aperture 19; lenses 21, 22, and 23 that configure "imaging lens"; a semiconductor laser drive section 32; a device for capturing the charged-particles 24; a charged particle detecting section 25; a signal processing section 26; a sample-hold pedestal 28; a sample SP; a light-emitting device 29 for removing electricity (second light source: LED); an LED drive section 35; and a sample pedestal drive section 34, where the apparatus changes the refractive power of the objective lens 16 or the display that shows magnification according to the voltage applied.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种用于测量静电潜像的方法和设备,该方法和设备调整显示的倍率以免在显示的倍率和实际倍率之间产生矛盾,并且提供一种图像形成设备,潜像载体,解决方案:用于测量静电潜像的设备主要包括带电粒子枪11;用于测量静电潜像的程序和计算机可读记录介质。孔12和12A;聚光镜13;光束消隐器14;光束偏转装置15;物镜16;带电粒子束驱动部31;排气装置33;一台计算机40;作为第一光源的半导体激光器17;准直透镜18;孔19;构成“成像透镜”的透镜21、22和23;半导体激光器驱动部分32;捕获带电粒子的装置24;带电粒子检测部25;信号处理部分26;采样座28;样本SP;用于除电的发光装置29(第二光源:LED); LED驱动部35;样品台驱动部分34,其中该设备根据所施加的电压来改变物镜16或显示放大率的显示器的折光力。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008065182A

    专利类型

  • 公开/公告日2008-03-21

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20060244746

  • 发明设计人 UEDA TAKESHI;

    申请日2006-09-08

  • 分类号G03G21/00;H01J37/28;H01J37/22;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:36

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