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PROGRAM PROFILING DEVICE, PROGRAM PROFILING METHOD, AND PROGRAM

机译:程序概要设计装置,程序概要方法和程序

摘要

PPROBLEM TO BE SOLVED: To provide a profiling device and the like capable of performing efficient profiling. PSOLUTION: When executing an execution program consisting of a plurality of methods, a statistic mode measurement part 231 measures the processing time of the executed methods. When the measured processing time is longer than a predetermined threshold value, a detail measurement object setting part 24 sets the methods having the processing time to be more detailed measurement objects by a detail data measurement part 232. The detail data measurement part performs more detailed measurement to the methods set as the measurement objects by the detail data measurement part 232, such as acquiring a stack trace. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:

要解决的问题:提供一种能够进行有效的剖析的剖析装置等。

解决方案:当执行由多种方法组成的执行程序时,统计模式测量部分231测量所执行的方法的处理时间。当测量的处理时间长于预定阈值时,细节测量对象设置部分24通过细节数据测量部分232将具有处理时间的方法设置为更细节的测量对象。细节数据测量部分执行更详细的测量。细节数据测量部分232设置为测量对象的方法,诸如获取堆栈轨迹。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008257287A

    专利类型

  • 公开/公告日2008-10-23

    原文格式PDF

  • 申请/专利权人 NTT DATA CORP;

    申请/专利号JP20070095389

  • 申请日2007-03-30

  • 分类号G06F11/34;G06F11/28;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:24

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