首页> 外国专利> LASER INTERFEROMETER LENGTH MEASUREMENT APPARATUS

LASER INTERFEROMETER LENGTH MEASUREMENT APPARATUS

机译:激光干涉仪测长仪

摘要

PROBLEM TO BE SOLVED: To more exactly compensate effects on length measurement accuracy caused by refractive index variations in a length measurement optical path, even when it is not easy to set a compensation-use sensor or a temperature adjusting mechanism near the length measurement optical path or in the whole area of the optical path.;SOLUTION: In a laser interferometer length measurement apparatus including a laser interferometer 2 for measuring a distance from an object 1 to be measured and a control means 9 for controlling at least one of refractive index variation parameters varying a refractive index of the length measurement optical path 3 ranging from the laser interferometer to the object to be measured, a means is disposed which calculates at least one of the refractive index variation parameters, a refractive index or those variations from an operation parameter of the control means, and a means is disposed which compensates a measurement value of the laser interferometer based on the above calculated results.;COPYRIGHT: (C)2008,JPO&INPIT
机译:要解决的问题:即使不容易在长度测量光路附近设置补偿用传感器或温度调节机构,也要更精确地补偿长度测量光路中折射率变化对长度测量精度的影响。解决方案:在激光干涉仪长度测量装置中,该装置包括用于测量距被测物体1的距离的激光干涉仪2和用于控制折射率变化中的至少一个的控制装置9。改变从激光干涉仪到被测物的长度测量光路3的折射率的参数,设置用于计算折射率变化参数,折射率或从操作参数的变化中的至少一个的装置。控制装置的一部分,并且设置有补偿激光干涉仪的测量值的装置r基于上述计算结果。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008170199A

    专利类型

  • 公开/公告日2008-07-24

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20070001941

  • 发明设计人 HARAYAMA TOMOHIRO;

    申请日2007-01-10

  • 分类号G01B9/02;H01L21/027;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:08

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