TEMPERATURE CYCLE TEST DEVICE AND TEMPERATURE CYCLE TEST METHOD

摘要

PROBLEM TO BE SOLVED: To perform a test in a test environment where the influence of the moisture absorption and dehydration of polyimide resin by moisture in the atmosphere is minimized when the temperature cycle test is applied to an electronic component.;SOLUTION: The electronic component 1, a cooling furnace 2, a heating furnace 3, an electronic component holding section 4, a movement mechanism 5, and the like are arranged in a chamber 9. A movement control controller 6, a temperature sensor 7, an electrical characteristic sensor 8, a hygrometer 12, and the like are disposed around the chamber 9. A temperature cycle test for recognizing the durability against the temperature difference of the electronic component is performed. At this time, the humidity environment of the electronic component in the chamber 9 is controlled to humidity 10% RH (temperature 25°C) or lower. By removing air from the inside of the chamber 9 and filling nitrogen gas, moisture absorption and dehydration phenomenon is prevented.;COPYRIGHT: (C)2008,JPO&INPIT