首页> 外国专利> Production method of front gate type SOI-MOSFET

Production method of front gate type SOI-MOSFET

机译:前栅型SOI-MOSFET的制造方法

摘要

Topic Source/drain expansion and the front gate (front gate) oneself the back gate which was made to adjust is included, it regards the production method of the FD type SOI-CMOS device.SolutionsAs for SOI-CMOS technology, as for polysilicon namely the poly- Si back gate, it is used in order to control the threshold voltage of the hurontogeto device, nMOS and the pMOS back gate are done, in independence, and in the front gate and independence, the switch mutually.Especially, the back gate, the front gate of the device and oneself offers the production method of the back gate FD type CMOS device which was adjusted to source/drain expansion. The back gate FD type CMOS device is produced the SIMOX or connection SOI- wafer, wafer bonding and thin film conversion, poly- Si etching, LP-CVD and machine chemical polishing (CMP) of making use. Selective figure Figure 17
机译:<主题>包括源/漏扩展和经过调整的前栅极(front gate)自身的后栅极,它涉及FD型SOI-CMOS器件的生产方法。多晶硅即多晶硅背栅,用于控制hurontogeto器件的阈值电压,nMOS和pMOS背栅是独立完成的,而在前栅和独立情况下则是相互切换的。背栅,器件的前栅和自身提供了根据源/漏扩展进行调整的背栅FD型CMOS器件的生产方法。使用SIMOX或连接SOI晶片,晶片键合和薄膜转换,多晶硅蚀刻,LP-CVD和机械化学抛光(CMP)生产背栅FD型CMOS器件。<选择图>图17

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号