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Method for evaluating uniformity of suplatast tosilate crystal, uniform crystal and method for producing the same

机译:评价最上层甲苯磺酸盐晶体的均匀性的方法,均匀晶体及其制造方法

摘要

A method for evaluating the uniformity of suplatast tosylate crystals, a crystal with uniform and stable optical purity, and a method for producing the same. In the method for evaluating the uniformity of suplatast tosylate crystals, (a) adding a solvent to the suplatast tosylate crystals to dissolve 3% or less of that amount, measuring a portion of the resulting suspension supernatant and measuring the optical purity (B) Next, a solvent is added to the remaining suspension to dissolve the whole amount, and a part of the solution is taken to measure the optical purity. The steps (a) and (b) A method for evaluating the uniformity of a suplatast tosylate crystal characterized by comparing the optical purity of the splatast tosilate crystal and a method for producing the same.
机译:评估磺基苯磺酸盐晶体的均匀性的方法,具有均匀且稳定的光学纯度的晶体及其制造方法。在评价苯磺酸上邻甲苯磺酸盐晶体的均匀性的方法中,(a)向苯磺酸上邻甲苯磺酸盐晶体中添加溶剂以溶解该量的3%以下,测量一部分所得悬浮液上清液并测量光学纯度(B)。然后,将溶剂添加到剩余的悬浮液中以溶解全部量,并取一部分溶液用于测量光学纯度。步骤(a)和(b)一种用于评估磺基磺酸盐晶体的均匀性的方法,其特征在于,比较该硅酸盐磺酸盐晶体的光学纯度及其制备方法。

著录项

  • 公开/公告号JPWO2006006616A1

    专利类型

  • 公开/公告日2008-04-24

    原文格式PDF

  • 申请/专利权人 大鵬薬品工業株式会社;

    申请/专利号JP20060529079

  • 发明设计人 生塩 孝則;永井 啓子;

    申请日2005-07-13

  • 分类号C07C381/12;G01N23/20;A61K31/167;A61P37/08;A61P43;A61P11/06;A61P17;A61P11/02;A61P7/10;A61P17/04;

  • 国家 JP

  • 入库时间 2022-08-21 20:17:10

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