Test program debugging device and semiconductor test equipment, test program debugging method, and method of exam

摘要

The test program debugging device of this invention has with the suffering test device simulator and the semiconductor test equipment simulator. And, the semiconductor test equipment simulator among the non verification range orders which are included in the non verification range which is the range other than the verification range inside the verification range acquisition section and the test program which acquire the verification range which is the range of the order which among of the test programs should verify, has with the order execution section which executes the non setting order which is simplified by the order simplification section and the verification range order, setting order, and order which are included in the verification range simplification section which simplifies the non setting order other than setting ordering in order to set the suffering test device simulator.