Automatic Test Equipment Receiving Diagnostic Information from Devices with Built-in Self Test

摘要

Automatic test equipment capable of receiving diagnostic information from a device under test having a built-in self-test system (BIST) and a diagnostic information collector in which the diagnostic information collector temporarily stores diagnostic patterns output by the BIST and provides a fault indication upon detecting a fault in the device under test. Such ATE comprises a device interface connectable to the device under test, a processing system and processing channels. The processing channels are each connected to the device interface and to the processing system and comprise test channels, a fault indication channel and a diagnostic information channel. The test channels are interoperable with the BIST to subject the device under test to a sequence of tests. The fault indication channel is connected to receive the fault indication from the device interface. The diagnostic information channel is operable in response to the fault indication received via the fault indication channel to receive from the device interface at least some of the diagnostic patterns temporarily stored in the device under test as the diagnostic information.