首页> 外国专利> Correcting multiple block data loss in a storage array using a combination of a single diagonal parity group and multiple row parity groups

Correcting multiple block data loss in a storage array using a combination of a single diagonal parity group and multiple row parity groups

机译:使用单个对角奇偶校验组和多个行奇偶校验组的组合来纠正存储阵列中的多个块数据丢失

摘要

A method for correcting double failures in a storage array has the following steps. A storage array is organized as a plurality of concatenated sub-arrays, each sub-array including a set of data storage devices and a row parity storage device. Row parity is computed for each row of each sub-array. The row parity of a particular sub-array is stored on a row parity storage device of the particular sub-array. A diagonal parity is computed across the concatenated sub-arrays. A double storage device failure is corrected using both the sub-array row parity and the diagonal parity.
机译:纠正存储阵列中双重故障的方法具有以下步骤。存储阵列被组织为多个串联的子阵列,每个子阵列包括一组数据存储设备和一个行奇偶校验存储设备。为每个子数组的每一行计算行奇偶校验。特定子阵列的行奇偶校验存储在特定子阵列的行奇偶校验存储设备上。对接子数组计算对角奇偶校验。使用子阵列行奇偶校验和对角奇偶校验,可以纠正双重存储设备故障。

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