首页> 外国专利> Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shiftin point-diffraction interferometry

Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shiftin point-diffraction interferometry

机译:使用相移点衍射干涉术原位和异位测量光学系统的空间脉冲响应的装置和方法

摘要

A test object including: an arrangement of optical elements defining a first partially reflecting surface and a second partially reflecting surface, at least one of the first and second partially reflecting surfaces being curved, wherein the first partially reflecting surface is arranged to receive a substantially collimated input beam and produce therefrom a first transmitted beam that passes on to the second partially reflecting surface, wherein the second partially reflecting surface is arranged to receive the first transmitted beam from the first partially reflecting surface and produce a collimated second transmitted beam and a first reflected beam therefrom, wherein the first partially reflecting surface is arranged to receive the first reflected beam and produce a second reflected beam therefrom, and wherein the first and second reflecting surfaces are configured to cause the second reflecting beam to converge onto a spot on a back surface to produce a diverging beam traveling in the same direction as the collimated output beam.
机译:一种测试物体,包括:光学元件的布置,其限定第一部分反射表面和第二部分反射表面,所述第一和第二部分反射表面中的至少一个是弯曲的,其中,所述第一部分反射表面被布置为接收基本准直的表面输入光束并从中产生传递到第二部分反射表面的第一透射光束,其中第二部分反射表面设置为从第一部分反射表面接收第一透射光束,并产生准直的第二透射光束和第一反射光束光束,其中第一部分反射面设置为接收第一反射光束并从中产生第二反射光束,第一和第二反射面配置为使第二反射光束会聚到背面的光斑上产生发散的光束n与准直输出光束的方向相同。

著录项

  • 公开/公告号US2008030742A1

    专利类型

  • 公开/公告日2008-02-07

    原文格式PDF

  • 申请/专利权人 HENRY A. HILL;

    申请/专利号US20070881141

  • 发明设计人 HENRY A. HILL;

    申请日2007-07-25

  • 分类号G01B11/02;G02B27/14;

  • 国家 US

  • 入库时间 2022-08-21 20:11:11

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