首页> 外国专利> MEMORY ELEMENT, METHOD FOR MANUFACTURING MEMORY ELEMENT, MEMORY DEVICE, ELECTRONIC APPARATUS AND METHOD FOR MANUFACTURING TRANSISTOR

MEMORY ELEMENT, METHOD FOR MANUFACTURING MEMORY ELEMENT, MEMORY DEVICE, ELECTRONIC APPARATUS AND METHOD FOR MANUFACTURING TRANSISTOR

机译:存储器元件,制造存储器元件的方法,存储器装置,电子设备以及晶体管的制造方法

摘要

A method for manufacturing a memory element including forming a first electrode on a first face of a substrate; forming a ferroelectric layer on a second face of the first electrode, the second face being on an opposite side to the substrate side, and the ferroelectric layer being mainly made of a crystalline organic ferroelectric material; and forming a second electrode on a third face of the ferroelectric layer, the third face being on an opposite side to the first electrode side, the second electrode being formed by ejecting an vaporized electrode material in a direction inclined with respect to a normal line direction of the substrate and depositing the vaporized electrode material on the third face of the ferroelectric layer, wherein data writing/reading is performed by changing a polarized state of the ferroelectric layer by applying a voltage between the first electrode and the second electrode.
机译:一种制造存储元件的方法,包括在衬底的第一面上形成第一电极;以及在第一电极的第二面上形成铁电层,该第二面在与基板侧相反的一侧,该铁电层主要由结晶有机铁电材料制成。在铁电层的第三面上形成第二电极,该第三面在与第一电极侧相反的一侧,第二电极通过沿相对于法线方向倾斜的方向喷射汽化的电极材料而形成。在衬底的第一部分上沉积蒸发的电极材料,并在铁电层的第三面上沉积汽化的电极材料,其中,通过在第一电极和第二电极之间施加电压来改变铁电层的极化状态来执行数据写入/读取。

著录项

  • 公开/公告号US2007281372A1

    专利类型

  • 公开/公告日2007-12-06

    原文格式PDF

  • 申请/专利权人 HIROSHI TAKIGUCHI;JUNICHI KARASAWA;

    申请/专利号US20070747653

  • 发明设计人 HIROSHI TAKIGUCHI;JUNICHI KARASAWA;

    申请日2007-05-11

  • 分类号H01L21;H01L21/8238;H01L21/8242;

  • 国家 US

  • 入库时间 2022-08-21 20:11:03

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