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Test data compression and decompression method using zero-detected run-length code in system-on-chip
Test data compression and decompression method using zero-detected run-length code in system-on-chip
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机译:使用片上系统的零检测游程码测试数据压缩和解压缩的方法
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摘要
A method of effectively compressing a test vector is introduced for testing a system-on-chip (SOC) semiconductor device. Since the number of test vectors is increased in a SOC, the number of ‘0’s is increased if adjacent test vectors are properly aligned using an ordering algorithm. ‘0000’ is considered as a single block and a counter of ‘0-group’ is incremented by one to encode each further instance of the string ‘0000’. A codeword capable of being decompressed can be generated using only a counter without using a memory block.
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