首页> 外国专利> Removing the effects of unknown test values from compacted test responses

Removing the effects of unknown test values from compacted test responses

机译:从压缩的测试响应中消除未知测试值的影响

摘要

Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.
机译:公开了用于过滤压缩的测试响应的方法,装置和系统。所述方法,装置和系统可以例如用于去除未知测试值的影响。例如,在一个实施例中,从被测电路的压紧器接收压紧的测试响应。在该实施例中,压缩测试响应包括取决于一个或多个相应的未知值的一个或多个压缩测试响应值。对压缩的测试响应进行滤波以去除至少一些压缩的测试响应值对一个或多个相应的未知值的依赖性,并且输出滤波后的测试响应。还公开了各种滤波电路和测试系统。

著录项

  • 公开/公告号US7395473B2

    专利类型

  • 公开/公告日2008-07-01

    原文格式PDF

  • 申请/专利权人 WU-TUNG CHENG;MANISH SHARMA;

    申请/专利号US20050258769

  • 发明设计人 MANISH SHARMA;WU-TUNG CHENG;

    申请日2005-10-25

  • 分类号G01R31/28;

  • 国家 US

  • 入库时间 2022-08-21 20:09:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号