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Common-path point-diffraction phase-shifting interferometer

机译:共路径点衍射相移干涉仪

摘要

A common-path, point-diffraction, phase-shifting interferometer uses a half wave plate having a diffractive element, such as pin hole. A coherent, polarized light source simultaneously generates a reference beam from the diffractive element and an object beam from remaining portions of the light going through the half wave plate. The reference beam has a nearly spherical wavefront. Each of the two beams possesses a different polarization state. The object and reference beams are then independently phase modulated by a polarization sensitive phase modulator that shifts phase an amount depending on applied voltage and depending on polarization state of the incident light. A polarizer is then used to provide the object and reference beams in the same polarization state with equal intensities so they can interfere to create an interferogram with near unity contrast.
机译:共路径,点衍射,相移干涉仪使用具有衍射元件(例如针孔)的半波片。相干的偏振光源同时从衍射元件产生参考光束,并从穿过半波片的其余部分产生物光束。参考光束具有近乎球形的波前。两个光束中的每一个都具有不同的偏振态。然后,由偏振敏感的相位调制器独立地对物光束和参考光束进行相位调制,该偏振敏感的相位调制器根据施加的电压和入射光的偏振状态来使相位偏移一定量。然后使用偏振器为处于相同偏振状态的物镜光束和参考光束提供相同的强度,以便它们可以干涉以产生具有接近统一对比度的干涉图。

著录项

  • 公开/公告号US7304746B2

    专利类型

  • 公开/公告日2007-12-04

    原文格式PDF

  • 申请/专利权人 WILLIAM J. COTTRELL;

    申请/专利号US20060501413

  • 发明设计人 WILLIAM J. COTTRELL;

    申请日2006-08-09

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-21 20:09:02

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