首页> 外国专利> Optical detection device and method for spectral analysis.

Optical detection device and method for spectral analysis.

机译:光学检测装置和光谱分析方法。

摘要

Optical detection device in particular for spectroscopic measurements from an illuminated line (5), wherein the device comprises multiple inlet openings (11.1-11.3) located in a planar arrangement, spaced apart along a first axis (10) parallel to the illuminated line (5); a device for imaging (12) defining an orthogonal optical axis (7) relative to the first axis (10) and the illuminated line (5); multiple diffraction gratings (15.1-15.3) located along a second axis (16) in a planar arrangement parallel to the planar array of apertures, wherein each grid is associated with a corresponding input aperture (11.1-11.3), and linear detection array (17) extending along a longitudinal axis parallel with, and laterally poised with respect to the second axis (16), wherein the lines of grating of the diffraction gratings (15.1, 15.2, 15.3) extend enun acute angle relative to the longitudinal axis of the linear detection array (17), wherein the axes the first, second and longitudinal are orthogonal with respect to the optical axis (Y), and wherein the diffraction gratings determine spectra from each input aperture impinge on different portions of the linear detection array.
机译:尤其是用于从照明线(5)进行光谱测量的光学检测装置,其中该装置包括多个入口开口(11.1-11.3),其位于平面布置中,沿着平行于照明线(5)的第一轴(10)间隔开);成像装置(12),其限定相对于第一轴(10)和照明线(5)的正交光轴(7);在平行于孔平面阵列的平面布置中沿第二轴(16)定位的多个衍射光栅(15.1-15.3),其中每个栅格与对应的输入孔(11.1-11.3)和线性检测阵列(17)相关)沿着平行于第二轴(16)并相对于第二轴(16)横向定位的纵轴延伸,其中衍射光栅(15.1,15.2,15.3)的光栅线相对于直线的纵轴成锐角延伸检测阵列(17),其中第一,第二和纵向轴相对于光轴(Y)正交,并且其中衍射光栅确定来自每个输入孔径的光谱,这些光谱入射在线性检测阵列的不同部分上。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号