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Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate
Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate
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机译:用于检测存在于不均匀分布的样品基质中的低水平的特性/质量特征的方法和采样装置
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摘要
A process for detecting low levels of a predetermined quality trait present in an inhomogeneously distributed particulate substrate involving the steps of: (a) providing a particulate substrate to be analyzed; (b) providing a spectrometer with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member located within the rotatable sample holder for tumbling the particulate substrate contained therein; (e) introducing the particulate substrate into the rotatable sample holder; (f) simultaneously rotating and tumbling the particulate substrate contained within the rotatable sample holder; and (g) activating the spectrometer, thereby illuminating the particulate substrate contained within the rotatable sample holder with electromagnetic radiation.
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