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Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate

机译:用于检测存在于不均匀分布的样品基质中的低水平的特性/质量特征的方法和采样装置

摘要

A process for detecting low levels of a predetermined quality trait present in an inhomogeneously distributed particulate substrate involving the steps of: (a) providing a particulate substrate to be analyzed; (b) providing a spectrometer with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member located within the rotatable sample holder for tumbling the particulate substrate contained therein; (e) introducing the particulate substrate into the rotatable sample holder; (f) simultaneously rotating and tumbling the particulate substrate contained within the rotatable sample holder; and (g) activating the spectrometer, thereby illuminating the particulate substrate contained within the rotatable sample holder with electromagnetic radiation.
机译:一种用于检测存在于不均匀分布的颗粒基质中的预定质量特征的低水平的方法,该方法包括以下步骤:(a)提供待分析的颗粒基质; (b)提供一种具有电磁检测器的光谱仪,该电磁检测器能够利用电磁辐射进行光谱测量; (c)提供一种具有透明区域的可旋转样品架,电磁辐射可以穿过该透明区域; (d)提供位于可旋转样品保持器内的翻滚构件,用于翻滚容纳在其中的颗粒基质。 (e)将颗粒状基质引入可旋转样品架中; (f)同时旋转和翻转包含在可旋转样品架中的颗粒状底物; (g)激活光谱仪,从而用电磁辐射照射包含在可旋转样品架中的颗粒基质。

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