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BOARD EXAMINATION METHOD AND BOARD EXAMINATION DEVICE

机译:板检查方法和板检查装置

摘要

[PROBLEMS] To provide a board examination method and device for examining a board under test by means of which the number of examinations of electrical connection of a wiring pattern provided to a board is small and the examination time is shortened. [MEANS FOR SOLVING PROBLEMS] The method examines a board in which terminals are provided on both sides of the board, the terminals on one side are interconnected, or the ones on the other side are interconnected, or the terminals on one side are connected to the one on the other side through a wiring pattern, and thereby nets are formed. The method is characterized in that electrical connection between the terminals in the nets on one side, electrical connection between the terminals in the nets on the other side, and electrical connection between one terminal on one side and one terminal on the other side in the same net as the terminal on the one side are examined.
机译:[问题]提供一种用于检查被测板的板检查方法和装置,通过该板检查方法和装置,对设置到板上的配线图案的电连接的检查次数少并且缩短了检查时间。 [解决问题的手段]该方法检查一种板,其中在板的两侧上设置端子,将一侧上的端子互连,或者将另一侧上的端子互连,或者将一侧上的端子连接至该板。一个通过布线图案在另一侧,从而形成网。该方法的特征在于,一侧的网络中的端子之间的电连接,另一侧的网络中的端子之间的电连接以及同一侧的一个端子和另一侧的一个端子之间的电连接。网作为一侧的终端进行检查。

著录项

  • 公开/公告号WO2007138831A1

    专利类型

  • 公开/公告日2007-12-06

    原文格式PDF

  • 申请/专利权人 NIDEC-READ CORPORATION;YAMASHITA MUNEHIRO;

    申请/专利号WO2007JP59686

  • 发明设计人 YAMASHITA MUNEHIRO;

    申请日2007-05-10

  • 分类号G01R31/02;

  • 国家 WO

  • 入库时间 2022-08-21 20:01:44

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