首页> 外国专利> INPUT TRACKING HIGH-LEVEL MULTIBIT QUANTIZER FOR DELTA-SIGMA ADC

INPUT TRACKING HIGH-LEVEL MULTIBIT QUANTIZER FOR DELTA-SIGMA ADC

机译:DELTA-SIGMA ADC的输入跟踪高电平多位量化器

摘要

A quantization circuit includes a plurality of resistors (R-0 to R-15), a plurality of tap points (16-3 to 16-15), and a plurality of coarse comparators (21-3 to 21-15). Each coarse comparator has a first input coupled to an input voltage (VSUBQin/SUB) and a second input coupled to a corresponding coarse tap point voltage. Each coarse comparator operates during a first phase to produce a "1 " only if the input voltage exceeds the corresponding coarse tap point voltage. A plurality of fine comparators (24-1 to 24-3) each have a first input coupled to the input voltage, and each fine comparator operates during a second phase to produce a fine output level indicative of whether the input voltage exceeds a corresponding tap point voltage of a group of tap points located immediately below the tap point connected to the highest coarse comparator producing a "1".
机译:量化电路包括多个电阻器(R-0至R-15),多个抽头点(16-3至16-15)以及多个粗略比较器(21-3至21-15)。每个粗略比较器具有耦合到输入电压(V )的第一输入和耦合到对应的粗抽头点电压的第二输入。仅当输入电压超过相应的粗抽头点电压时,每个粗比较器才在第一阶段工作以产生“ 1”。多个精细比较器(24-1至24-3)每个都具有耦合到输入电压的第一输入,并且每个精细比较器在第二阶段运行以产生精细输出电平,该精细输出电平指示输入电压是否超过相应抽头位于抽头点正下方的一组抽头点的点电压,该抽头点连接到最高粗比较器,产生“ 1”。

著录项

  • 公开/公告号WO2008028142A3

    专利类型

  • 公开/公告日2008-05-02

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;YANG YUQING;

    申请/专利号WO2007US77412

  • 发明设计人 YANG YUQING;

    申请日2007-08-31

  • 分类号H03M1/66;

  • 国家 WO

  • 入库时间 2022-08-21 20:00:41

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