首页> 外国专利> METHOD OF STANDARD-LESS PHASE ANALYSIS BY MEANS OF A DIFFRACTOGRAM

METHOD OF STANDARD-LESS PHASE ANALYSIS BY MEANS OF A DIFFRACTOGRAM

机译:差示图法进行无相分析的方法

摘要

A method of determining the concentrations of the constituents in a mixture of substances by way of an X-ray diffractogram of the mixture. The fundamental difficulty that it is not possible to determine the entire power spectrum (PS) of the diffraction is avoided by making a suitable estimate of the PS on the basis of the diffractions that can be observed. Using an estimate of the dispersive power of the individual atoms in the unity cells of the constitutents and the PS, the absolute intensities are determined from the relative intensities and on the basis thereof the concentrations of the constituents in the mixture are determined.
机译:一种通过混合物的X射线衍射图确定物质混合物中成分浓度的方法。通过基于可观察到的衍射对PS进行适当的估计,避免了不可能确定衍射的整个功率谱(PS)的基本困难。使用对组成原子和PS的单胞中各个原子的分散能力的估计,从相对强度确定绝对强度,并基于其确定混合物中各组分的浓度。

著录项

  • 公开/公告号EP0961931B1

    专利类型

  • 公开/公告日2008-04-23

    原文格式PDF

  • 申请/专利权人 PANALYTICAL BV;

    申请/专利号EP19980957075

  • 发明设计人 REEFMAN DERK;

    申请日1998-12-14

  • 分类号G01N23/207;

  • 国家 EP

  • 入库时间 2022-08-21 19:59:54

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号