首页> 外国专利> SYSTEMS AND METHODS FOR ANALYZING AND ASSESSING DEPRESSION AND OTHER MOOD DISORDERS USING ELECTROENCEPHALOGRAPHIC (EEG) MEASUREMENTS

SYSTEMS AND METHODS FOR ANALYZING AND ASSESSING DEPRESSION AND OTHER MOOD DISORDERS USING ELECTROENCEPHALOGRAPHIC (EEG) MEASUREMENTS

机译:使用心电图(EEG)测量分析和评估抑郁症和其他情绪障碍的系统和方法

摘要

This invention is directed to systems and methods for analyzing depression, and more particularly relates to systems and methods for analyzing and assessing depression and mood disorders in an individual using electroencephalograph ic measurements. Embodiments of the invention are not limited to depression, but can also include other mood disorders such as bipolar disorder and other disorders with at least one genetic-related component.
机译:本发明涉及用于分析抑郁症的系统和方法,并且更具体地涉及用于使用脑电图测量来分析和评估个体中的抑郁症和情绪障碍的系统和方法。本发明的实施方案不限于抑郁症,还可以包括其他情绪障碍,例如躁郁症和具有至少一种遗传相关成分的其他障碍。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号