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OPTICAL SYSTEM FOR PROBING TESTER AND PROBING METHOD USING THE SAME

机译:探测仪的光学系统及其使用的探测方法

摘要

An optical system for a probing tester and a probing method using the same are provided to more precisely and easily position a mark image on an optical axis of a first imaging device. An optical system for a probing tester includes a first imaging device(100) and a second imaging device(200). The first imaging device includes a reference mark(120), a first lens unit, a beam splitter, and a first camera. The first lens unit forms a mark image for the reference mark at a first reference position(a) in a desired size. The beam splitter passes light of a lens unit direction from the reference mark and reflects light of an opposite direction. The first camera picks up the mark image recognized by being reflected from the beam splitter. The second imaging device includes a second lens unit and a second camera. The second lens unit forms an image for the mark image at a second reference position(b) in a desired size. The second camera picks up the image formed at the second reference position.
机译:提供一种用于探测测试仪的光学系统和使用该探测仪的探测方法,以将标记图像更精确且容易地定位在第一成像装置的光轴上。用于探测测试仪的光学系统包括第一成像装置(100)和第二成像装置(200)。第一成像装置包括参考标记(120),第一透镜单元,分束器和第一照相机。第一透镜单元以期望的尺寸在第一基准位置(a)处形成用于基准标记的标记图像。分束器使来自参考标记的透镜单元方向的光通过,并反射相反方向的光。第一照相机拾取通过从分束器反射而识别的标记图像。第二成像装置包括第二透镜单元和第二照相机。第二透镜单元在第二参考位置(b)以期望的尺寸形成用于标记图像的图像。第二照相机拾取在第二参考位置处形成的图像。

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