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APPARATUS AND METHOD FOR ANALYZING EXAMINEE'S RESPONSE, APPARATUS FOR TESTING APTITUDE
APPARATUS AND METHOD FOR ANALYZING EXAMINEE'S RESPONSE, APPARATUS FOR TESTING APTITUDE
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机译:用于分析应试者的反应的装置和方法,用于测试姿势的装置
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摘要
An apparatus and a method for analyzing subject response and an apparatus for testing an aptitude are provided conveniently to perform an aptitude test and obtain information about a subject inherent psychological change for each content such as favorable feeling. An apparatus for analyzing subject response includes a stimulus unit(300), a measuring unit(310), and an analyzing unit(320). The stimulus unit gives a predetermined stimulus to a subject. The measuring unit measures subject brain waves in response to the stimulus. The analyzing unit analyzes the subject response to the stimulus based on a signal within a predetermined time after giving the stimulus to the subject, wherein the predetermined time includes a time where before a neural signal in response to the stimulus reaches a subject cerebrum after giving the stimulus to the subject.
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