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APPARATUS AND METHOD FOR ANALYZING EXAMINEE'S RESPONSE, APPARATUS FOR TESTING APTITUDE

机译:用于分析应试者的反应的装置和方法,用于测试姿势的装置

摘要

An apparatus and a method for analyzing subject response and an apparatus for testing an aptitude are provided conveniently to perform an aptitude test and obtain information about a subject inherent psychological change for each content such as favorable feeling. An apparatus for analyzing subject response includes a stimulus unit(300), a measuring unit(310), and an analyzing unit(320). The stimulus unit gives a predetermined stimulus to a subject. The measuring unit measures subject brain waves in response to the stimulus. The analyzing unit analyzes the subject response to the stimulus based on a signal within a predetermined time after giving the stimulus to the subject, wherein the predetermined time includes a time where before a neural signal in response to the stimulus reaches a subject cerebrum after giving the stimulus to the subject.
机译:方便地提供了用于分析对象响应的设备和方法以及用于测试能力的设备,以执行能力测试并针对每个内容(例如,良好的感觉)获得关于对象固有的心理变化的信息。用于分析对象反应的设备包括刺激单元(300),测量单元(310)和分析单元(320)。刺激单元对受试者给予预定的刺激。测量单元响应刺激测量对象脑电波。分析单元基于在对受试者给予刺激之后的预定时间内的信号来分析受试者对刺激的响应,其中所述预定时间包括在给予神经刺激后响应于刺激的神经信号到达受试者大脑之前的时间。对主题的刺激。

著录项

  • 公开/公告号KR20080039808A

    专利类型

  • 公开/公告日2008-05-07

    原文格式PDF

  • 申请/专利权人 KANG MAHN HEE;

    申请/专利号KR20070110092

  • 发明设计人 KANG MAHN HEE;

    申请日2007-10-31

  • 分类号A61B5/0482;A61B5/0476;

  • 国家 KR

  • 入库时间 2022-08-21 19:53:46

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