首页> 外国专利> SYSTEM AND METHOD FOR AUTOMATICALLY-DETECTING SOFT ERRORS IN LATCHES OF AN INTEGRATED CIRCUIT

SYSTEM AND METHOD FOR AUTOMATICALLY-DETECTING SOFT ERRORS IN LATCHES OF AN INTEGRATED CIRCUIT

机译:自动检测集成电路的闩锁中的软错误的系统和方法

摘要

A circuit and method for detecting soft errors produced in latches. An exemplary embodiment of a circuit includes a block of concatenated latches, each latch having a comparator, with an output from the final latch comparator representing a parity bit for the latch block. The circuit further includes a element to store the block parity bit, and a comparator for the block parity bit and stored parity bit. A latch soft error is detected by monitoring an output from the parity bit comparator, which signals an error when the latch block parity bit changes state.
机译:用于检测在锁存器中产生的软错误的电路和方法。电路的示例性实施例包括级联锁存器块,每个锁存器具有比较器,来自最终锁存器比较器的输出表示锁存器块的奇偶校验位。该电路还包括用于存储块奇偶校验位的元件,以及用于块奇偶校验位和存储的奇偶校验位的比较器。通过监视奇偶校验位比较器的输出来检测锁存器软错误,当锁存器块奇偶校验位更改状态时,该输出会发出错误信号。

著录项

  • 公开/公告号KR100816130B1

    专利类型

  • 公开/公告日2008-03-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20067006409

  • 发明设计人 슈나이더 로니;

    申请日2006-03-31

  • 分类号H03K19/003;H03K3/037;

  • 国家 KR

  • 入库时间 2022-08-21 19:52:20

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