首页> 外国专利> A METHOD FOR DETERMINING A CRITICAL SIZE FOR AN ALUMINUM OXIDE INCLUSION IN AN ALUMINUM OR AN ALUMINUM ALLOY SPUTTER TARGET

A METHOD FOR DETERMINING A CRITICAL SIZE FOR AN ALUMINUM OXIDE INCLUSION IN AN ALUMINUM OR AN ALUMINUM ALLOY SPUTTER TARGET

机译:确定铝或铝合金溅射靶中氧化铝的临界尺寸的方法

摘要

The present invention relates to a method for determining the critical size to the diameter of the Al 2 O 3 inclusions 38 in the Al or Al alloy sputtering target 42 to prevent arcing during sputtering. The method includes providing a sputtering apparatus having an argon plasma. Plasma, has a plasma sheath of a known thickness during sputtering, the Al or Al alloy sputtering target having a sputtering surface free of Al 2 O 3 containing water under a selected sputtering environment. When the thickness of the sheath is known for a selected sputtering environment, the critical size for the Al 2 O 3 inclusions 38 may be determined based on the thickness of the sheath. More specifically, Al 2 O 3 the diameter of the inclusions 38 in the Al or Al alloy sputtering target 42, must be less than the thickness of the plasma sheath during sputtering under it said selected sputtering environment in order to prevent arcing. ; Sputtering, plasma sheath, arcing
机译:本发明涉及一种确定在Al或Al合金溅射靶42中Al 2 O 3 夹杂物38的直径的临界尺寸以防止电弧放电过程中产生电弧的方法。溅射。该方法包括提供具有氩等离子体的溅射设备。等离子体具有在溅射过程中具有已知厚度的等离子体鞘,该Al或Al合金溅射靶在选择的溅射条件下具有不含水的Al 2 O 3 的溅射表面环境。当对于选定的溅射环境已知护套的厚度时,可以基于护套的厚度来确定Al 2 O 3 夹杂物38的临界尺寸。更具体地,Al或铝合金溅射靶42中的夹杂物38的直径Al 2 O 3 必须小于在以下条件下的溅射期间的等离子体鞘的厚度。它说选择溅射环境是为了防止产生电弧。 ;溅射,等离子护套,电弧

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