首页> 外国专利> Semiconductor memory device including both data redundancy memory cell array and local redundancy memory cell array and redundancy method thereof

Semiconductor memory device including both data redundancy memory cell array and local redundancy memory cell array and redundancy method thereof

机译:包括数据冗余存储单元阵列和本地冗余存储单元阵列的半导体存储装置及其冗余方法

摘要

having all of the data redundancy memory cell array and the redundancy memory cell array in the local semiconductor memory device and the semiconductor memory The redundancy method of the device is disclosed. The semiconductor memory device according to the invention a plurality of normal memory blocks and a redundancy memory block at least one data line and a redundancy control. A plurality of normal memory blocks and a redundancy memory cell array, each local to replace defects generated in a normal memory cell array and the normal memory cell array in the column unit. At least one or more data lines each having a redundancy memory block is data redundancy memory cell array for replacing a plurality of the normal defect occurred in the normal memory cell array of memory cells in a column block unit. One of the redundancy control unit in the event of a defect in at least two or more columns that are included in the normal memory cell arrays, a part of the column is replaced with the column data line and the other part of the redundancy memory cell array in the column is the local redundancy memory cell array The alternative to the column.
机译:在本地半导体存储器件和半导体存储器中具有全部的数据冗余存储单元阵列和冗余存储单元阵列。公开了该器件的冗余方法。根据本发明的半导体存储器件包括多个普通存储块和一个冗余存储块,至少一条数据线和一个冗余控制。多个普通存储块和冗余存储单元阵列,每个局部以替换在列单元中的普通存储单元阵列和普通存储单元阵列中产生的缺陷。分别具有冗余存储块的至少一条或多条数据线是数据冗余存储单元阵列,用于替换以列块为单位的存储单元的普通存储单元阵列中出现的多个普通缺陷。在正常存储单元阵列中包括的至少两个或更多列中出现故障的情况下,冗余控制单元之一,该列的一部分被列数据线替换,而另一部分被冗余存储单元替换列中的阵列是本地冗余存储单元阵列。

著录项

  • 公开/公告号KR100855961B1

    专利类型

  • 公开/公告日2008-09-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20060071568

  • 发明设计人 정한균;허낙원;고승범;

    申请日2006-07-28

  • 分类号G11C29/00;

  • 国家 KR

  • 入库时间 2022-08-21 19:51:40

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