Substrate to the optical dilatometer measurements of the anisotropy of thermal expansion calculation of thermal linear expansion coefficient of metal foil MALOUPRUGIH FILMS

摘要

The substrate to an optical dilatometer for measuring the anisotropy of thermal expansion, determining the thermal linear expansion coefficient of metal foils and malouprugih films, characterized in that to increase the accuracy and reliability of measurement results of the substrate has a longitudinal and transverse channels for containing several samples of foils or films that eliminates transverse deformation effect and allows samples simultaneously to measure their thermal expansion, the substrate is simultaneously control pa mer.