DEVICE FOR MEASUREMENT OF HIGH QUANTITIES OF COMPLEX DIELECTRIC CONSTANT OF LOW-IMPEDANCE COMPOSITE MATERIALS AT SHF

摘要

FIELD: measurement of electrical quantities, applicable in production of existing and new absorbing materials of the carbon plastic type and is used in the SHF band, as well as for monitoring of the electrical parameters of the dielectric constant and the loss tangent of a dielectric.;SUBSTANCE: the device has an H-waveguide short-circuited on the end, and a large-length longitudinal slot is made on one of the crest-walls in parallel with the axis of the H-waveguide. The slot is made with matching bevels, the slot width coincides with the width of the respective crest wall of the H-waveguide, and gets closed with a standard short-circuiting switch in the process of measurement.;EFFECT: receiving of a more precise measuring information on the value of the complex dielectric constant of low-impedance composite materials.;3 dwg