Integrated circuit`s e.g. remote sensor, part e.g. processor, testing method for radio frequency identification system, involves contactless selecting result of functional test by testing device

摘要

The method involves providing electrical operating energy for an integrated circuit (2) by a testing device. A functional test of a circuit part e.g. processor (3), is implemented by the integrated circuit in dependent of a condition of a release mechanism such as diode (10) and conductor path section, of the integrated circuit. The result of the functional test is contactless selected by the testing device. The electrical operating energy is provided by transmitting an electromagnetic field through the testing device.