首页> 外国专利> Stray radiation correcting method for X-ray imaging system, involves logarithmizing measuring signal of X-ray detector, subtracting correction values from signal, and identifying stray radiation signal during radiography of object

Stray radiation correcting method for X-ray imaging system, involves logarithmizing measuring signal of X-ray detector, subtracting correction values from signal, and identifying stray radiation signal during radiography of object

机译:X射线成像系统的杂散辐射校正方法,涉及对X射线检测器的测量信号进行对数处理,从信号中减去校正值,以及在对物体进行射线照相时识别杂散辐射信号

摘要

The method involves digitalizing and logarithmizing a measuring signal of an X-ray detector, which receives radiography of an examination object. Correction values are subtracted from the logarithmized measuring signal, and are obtained from a series expansion of a logarithm. A predetermined stray radiation signal is identified during radiography of an examination object. The correction values are selected from a look-up table. An independent claim is also included for an X-ray imaging system comprising an X-ray source.
机译:该方法包括数字化和对数化X射线探测器的测量信号,该探测器接收检查对象的射线照相。从对数测量信号中减去校正值,并从对数的级数展开中获得校正值。在检查对象的射线照相期间识别预定的杂散辐射信号。从查找表中选择校正值。对于包括X射线源的X射线成像系统也包括独立权利要求。

著录项

  • 公开/公告号DE102006040852A1

    专利类型

  • 公开/公告日2008-03-13

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20061040852

  • 发明设计人 STIERSTORFER KARL;

    申请日2006-08-31

  • 分类号G01N23/04;A61B6/03;G03B42/02;H04N5/325;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:43

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