Memory chip i.e. dynamic RAM memory chip, testing method, involves determining that all data outputs of memory chips lie close to logical zero and one, if signal level at input falls below and exceeds threshold level, respectively

摘要

The method involves determining that all data outputs (20) of memory chips (12) lie close to a logical zero, if a signal level at a selected data input (18) of a testing device (10) falls below a preset threshold level. The chips are connected with the selected data input of the testing device, and another determination is made that the data outputs of the chips lie close to a logical one, if the signal level at the input of the testing device exceeds the preset threshold level. An independent claim is also included for a testing device for testing a memory chip comprising data outputs and data inputs.