首页>
外国专利>
Method and device for the in-situ examination of mechanically loaded test objects by means of computed tomography
Method and device for the in-situ examination of mechanically loaded test objects by means of computed tomography
展开▼
机译:通过计算机断层摄影术对机械负载的测试对象进行原位检查的方法和设备
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention relates to an X-ray inspection system comprising an X-ray tube 3 and a detector 5 and an examination device arranged therebetween. According to the invention, it is provided that the examination device has a loading device 6 which has a fixed part 8 and a punch 14 movable linearly therebetween, between which a test object 15 for mechanical loading, in particular application of pressure, can be brought. In addition, the invention relates to a method for recording structures, in particular deformations and defects, such as cracks 16, in a test object 15 by the test object 15 is introduced into an X-ray inspection system, there acts a mechanical load on the test object 15 and an X-ray in this burdened condition is made.
展开▼