首页> 外国专利> Workpiece contour e.g. chamfer, processing method, involves automatically determining processing parameters based on geometrical data, and implementing processing cycle for processing workpiece contour using processing parameters

Workpiece contour e.g. chamfer, processing method, involves automatically determining processing parameters based on geometrical data, and implementing processing cycle for processing workpiece contour using processing parameters

机译:工件轮廓倒角加工方法,涉及基于几何数据自动确定加工参数,并实现利用加工参数加工工件轮廓的加工循环

摘要

The method involves detecting geometrical data of a workpiece (1) using a sensor unit (31'). Processing parameters are automatically determined based on the determined geometrical data. A processing cycle for processing a workpiece contour e.g. edge (42), is implemented using the processing parameters. The geometrical data comprises the position, dimensions, alignment and the surface condition of the workpiece. A determination of the position, the alignment and the dimensions of the workpiece are performed using an optical grid method based on triangulation. An independent claim is also included for a device for sharpening of contours such as side surfaces, chamfers and edges of a workpiece.
机译:该方法包括使用传感器单元(31')检测工件(1)的几何数据。根据确定的几何数据自动确定加工参数。用于加工工件轮廓的加工循环使用处理参数来实现边缘(42)。几何数据包括工件的位置,尺寸,对齐方式和表面状况。使用基于三角测量的光栅方法确定工件的位置,对准和尺寸。还包括用于对轮廓进行锐化的装置的轮廓,所述轮廓例如是工件的侧表面,倒角和边缘。

著录项

  • 公开/公告号DE102007003891A1

    专利类型

  • 公开/公告日2008-07-31

    原文格式PDF

  • 申请/专利权人 HERBERT ARNOLD GMBH & CO. KG;

    申请/专利号DE20071003891

  • 发明设计人 KNETSCH ROGER;

    申请日2007-01-19

  • 分类号B24B9/02;B24B9/06;B23C3/12;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:27

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