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Workpiece contour e.g. chamfer, processing method, involves automatically determining processing parameters based on geometrical data, and implementing processing cycle for processing workpiece contour using processing parameters
Workpiece contour e.g. chamfer, processing method, involves automatically determining processing parameters based on geometrical data, and implementing processing cycle for processing workpiece contour using processing parameters
The method involves detecting geometrical data of a workpiece (1) using a sensor unit (31'). Processing parameters are automatically determined based on the determined geometrical data. A processing cycle for processing a workpiece contour e.g. edge (42), is implemented using the processing parameters. The geometrical data comprises the position, dimensions, alignment and the surface condition of the workpiece. A determination of the position, the alignment and the dimensions of the workpiece are performed using an optical grid method based on triangulation. An independent claim is also included for a device for sharpening of contours such as side surfaces, chamfers and edges of a workpiece.
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