首页> 外国专利> Spring contact for use in contact device for contacting semiconductor chip with electronic device, has contact section having sectional axis that coincides with tangent or passant to cladding surface, where surface covers spring extensively

Spring contact for use in contact device for contacting semiconductor chip with electronic device, has contact section having sectional axis that coincides with tangent or passant to cladding surface, where surface covers spring extensively

机译:用于在使半导体芯片与电子设备接触的接触设备中使用的弹簧触头,其接触部分的截面轴与包层表面的切线或钝点重合,该表面广泛覆盖弹簧

摘要

The spring contact (1) has contact sections (11, 13) with contact points (12, 14), and a spring (15) arranged between the contact sections, such that the contact sections are subjected with a force component by the spring. The force component presses the contact sections apart. The contact section (11) exhibits a sectional axis (AF) at its contact point-sided end, and is movable along the sectional axis. The sectional axis coincides with a tangent or a passant to a cladding surface (H), where the surface covers the spring of the contact extensively.
机译:弹簧触头(1)具有带有触头(12、14)的触头部分(11、13)以及布置在触头部分之间的弹簧(15),使得触头部分受到弹簧的分力。力分量将接触部分压开。接触部段(11)在其接触点侧的端部处具有截面轴线(AF),并且可沿该截面轴线移动。截面轴与包层表面(H)的切线或传递点重合,该表面广泛覆盖触点的弹簧。

著录项

  • 公开/公告号DE102007006515A1

    专利类型

  • 公开/公告日2008-08-14

    原文格式PDF

  • 申请/专利权人 YAMAICHI ELECTRONICS DEUTSCHLAND GMBH;

    申请/专利号DE20071006515

  • 发明设计人 LINKE THOMAS;

    申请日2007-02-09

  • 分类号H01R4/48;H01L23/50;H01R12/04;H01R33/74;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:27

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