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Device for determining the quality of the technologies when examining or analyzing substances by application of wave or particle radiation
Device for determining the quality of the technologies when examining or analyzing substances by application of wave or particle radiation
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机译:通过波或粒子辐射检查或分析物质时确定技术质量的装置
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摘要
The device sets a definite correlation between variables of defects of an image quality indicator and points of a coordinate system. The defects of the image quality indicator are marked by points in the coordinate system in curves of regularity, where the variables of the defects are same in coordinates of the points in the coordinate system. The coordinates of the points between surfaces and origins of the coordinate system are indicated for the variables of defects. An independent claim is also included for a method for determining quality of technology during examining and analyzing a material.
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