首页> 外国专利> CONTACT VIBRATION GAUGE AND SURFACE ASPECT MEASURING DEVICE EQUIPPED THEREWITH

CONTACT VIBRATION GAUGE AND SURFACE ASPECT MEASURING DEVICE EQUIPPED THEREWITH

机译:配备有接触式振动规和表面纵横比的测量装置

摘要

PROBLEM TO BE SOLVED: To provide a contact vibration gauge and surface aspect measuring device equipped therewith, capable of measuring vibration to a frequency higher than responsible bandpass controlled by constant measuring force on examined objects and reducing the influence due to mass effect.;SOLUTION: The surface aspect measuring device equipped with a contact vibration gauge includes a force sensor 1 detecting measuring force generated during time of contact with examined objects to output as force detection signal; a drive actuator 133 for moving the force sensor 1, in response to the vibration of the examined objects; a probe 130 possessing a scale detector 135 for detecting position displacement information of the force sensor 1 to output as displacement signal; a force controlling loop RF for comparing force detection signal as force feedback signal with a force setting value to drive the actuator 133 so as to make the force feedback signal agree with the setting value; and a signal converter 240 for combining a force detection signal and the displacement signal to obtain oscillation amplitude of the examined objects.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种接触式振动计和表面纵横比测量装置,该装置能够将振动测量到高于通过恒定测量力控制被测物体所控制的有效带通的频率,并减少由于质量效应引起的影响。配备有接触振动计的表面纵横测量装置包括:力传感器1,其检测在与被检体接触时产生的测量力,并作为力检测信号输出;驱动致动器133,用于响应于被检查物体的振动而移动力传感器1。探头130具有刻度检测器135,该刻度检测器135用于检测力传感器1的位置位移信息以作为位移信号输出。力控制环RF,用于将作为力反馈信号的力检测信号与力设定值进行比较以驱动致动器133,以使力反馈信号与设定值一致;信号转换器240,用于将力检测信号和位移信号进行组合以获得被检物体的振荡幅度。;版权所有:(C)2009,日本特许厅

著录项

  • 公开/公告号JP2009180667A

    专利类型

  • 公开/公告日2009-08-13

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20080021314

  • 发明设计人 IGASAKI SHIRO;YAMAGATA MASAYOSHI;

    申请日2008-01-31

  • 分类号G01H1/00;G01B5/004;G01B21/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:46:11

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