首页> 外国专利> THIN FILM TEST PIECE STRUCTURE, ITS MANUFACTURING METHOD, ITS TENSILE TEST METHOD, AND TENSILE TESTING DEVICE

THIN FILM TEST PIECE STRUCTURE, ITS MANUFACTURING METHOD, ITS TENSILE TEST METHOD, AND TENSILE TESTING DEVICE

机译:薄膜测试件的结构,其制造方法,拉伸测试方法和拉伸测试装置

摘要

PROBLEM TO BE SOLVED: To perform accurately a tensile test by using a test piece comprising a thin film material.;SOLUTION: This thin film test piece structure 1 used for the tensile test is equipped with a thin film test piece 2 provided with a test object part 2a and a load transfer part 2b successive thereto, and a support member 3 for supporting at least a part excluding the test object part 2a of the thin film test piece 2. The support member 3 has a test piece support part 3a bonded to the load transfer part 2b, a frame part 3c arranged on the periphery separated from the thin film test piece 2, and elastic connection parts 3d, 3e for connecting the test piece support part 3a relatively displaceably in a tensile direction to the frame part 3c.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:为了通过使用包括薄膜材料的测试件来精确地执行拉伸测试;解决方案:该用于拉伸测试的薄膜测试件结构1配备有设有测试的薄膜测试件2。物体部分2a和与其相连的载荷传递部分2b,以及用于支撑至少一部分薄膜测试片2的除了测试物体部分2a之外的部分的支撑构件3。支撑构件3具有粘合到其上的测试片支撑部分3a。载荷传递部2b,配置在与薄膜测试片2分离的周围的框架部3c,和用于将测试片支撑部3a在拉伸方向上相对位移地连接于框架部3c的弹性连接部3d,3e。 ;版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009156725A

    专利类型

  • 公开/公告日2009-07-16

    原文格式PDF

  • 申请/专利权人 HYOGO PREFECTURE;

    申请/专利号JP20070335667

  • 发明设计人 NAMAZU TAKAHIRO;NAGAI YUJI;

    申请日2007-12-27

  • 分类号G01N3/08;G01N3/00;G01N3/04;G01N1/28;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号