首页> 外国专利> METHOD AND APPARATUS THEREFOR FOR SIMULTANEOUSLY IMAGING SURFACE OF OBJECT TO BE MEASURED AND GRANULAR SPOT PATTERN BY LASER REFLECTED LIGHT

METHOD AND APPARATUS THEREFOR FOR SIMULTANEOUSLY IMAGING SURFACE OF OBJECT TO BE MEASURED AND GRANULAR SPOT PATTERN BY LASER REFLECTED LIGHT

机译:激光反射光同时成像和颗粒斑点成像的成像方法及装置

摘要

PROBLEM TO BE SOLVED: To provide a method and an apparatus therefor for simultaneously imaging a granular spot pattern as the reflected light of irradiated laser light, and the surface of a part on which the laser is irradiated.;SOLUTION: The method irradiates the surface of the object 1 to be measured with laser light 4, allows the irradiated laser light to be reflected diffusely based on the state of the rough surface of the surface of the object 1 to be measured to generate a granular spot pattern in the air, and installs a dark field tube 8 for shielding external light and a convex lens 9 at a predetermined position in front of a CCD element 7, thereby simultaneously capturing an image in which the laser light is irradiated on the surface of the object 1 to be measured and the granular spot pattern.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种用于同时成像颗粒斑点图案作为被照射的激光的反射光以及被照射的激光的部件的表面的方法和装置;解决方案:该方法照射该表面利用激光4对被检体1进行照射,基于被检体1的表面的粗糙面的状态,使被照射的激光漫反射,从而在空气中产生颗粒状的斑点图案。在CCD元件7的前面的预定位置处安装用于屏蔽外部光的暗场管8和凸透镜9,从而同时捕获其中在被测物体1的表面上照射激光的图像,并且颗粒状斑点图案。; COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009128084A

    专利类型

  • 公开/公告日2009-06-11

    原文格式PDF

  • 申请/专利权人 TOYO SEIKI SEISAKUSHO:KK;

    申请/专利号JP20070301113

  • 发明设计人 KOBAYASHI KOICHI;

    申请日2007-11-21

  • 分类号G01B11/00;G01N21/84;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:42

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号