NEAR-FIELD PROBE, CANTILEVER OF NEAR-FIELD RAMAN SPECTROSCOPIC SYSTEM, NEAR-FIELD RAMAN SPECTROSCOPIC SYSTEM AND METHOD OF CONTROLLING NEAR-FIELD RAMAN SPECTROSCOPIC SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a near-field probe capable of increasing an electric field of an s polarization component, the cantilever of a near-field Raman spectroscopic system using the same and the near-field Raman spectroscopic system.;SOLUTION: The near-field probe 10 is constituted so that its leading end 10a is processed into a spatulalike shape to have a plane vertical to the long axis of the probe and the shape of the plane is a rectangular shape composed of a short side (a) and a long side (b). When the near-field probe 10 is used, light in a polarization direction parallel to the short side (a) is thrown on the near-field probe 10. The cantilever 15 of a near-field Raman spectroscopic system 40 is the general cantilever of an atomic force microscope and includes the near-field probe 10 at the leading end of the free end. The near-field Raman spectroscopic system 40 includes the cantilever 15 and an optical system used for the incidence of light in a polarization direction parallel to the short side (a) in the near-field probe 10 of the cantilever 15.;COPYRIGHT: (C)2009,JPO&INPIT