首页> 外国专利> MICROSCOPE WITH IMAGING APPARATUS AND METHOD FOR CALCULATING ITS EXPOSURE TIME

MICROSCOPE WITH IMAGING APPARATUS AND METHOD FOR CALCULATING ITS EXPOSURE TIME

机译:具有成像装置的显微镜及其曝光时间的计算方法

摘要

PPROBLEM TO BE SOLVED: To provide a microscope with an imaging apparatus capable of rapidly determining an optimum exposure condition as a whole with simple constitution even when dividing a sample to many partial areas and performing microscopic imaging, and a method for calculating its exposure time. PSOLUTION: The microscope with the imaging apparatus which acquires a desired entire image by connecting a plurality of partial images obtained by successively imaging a part of the sample that is a subject in the prescribed same exposure condition is equipped with an exposure condition arithmetic operation part arithmetically operating the prescribed same exposure condition on the basis of relation between a flow image obtained by exposing the sample that is the subject while scanning the sample in a prescribed period by driving a sample stand on which the sample that is the subject is placed and the prescribed period. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:<解决的问题:提供一种具有成像设备的显微镜,该成像设备即使在将样品分成多个局部区域并进行显微成像的情况下,也能够以简单的结构整体上快速确定最佳曝光条件,并且提供了一种计算其的方法接触时间。

解决方案:具有通过将在规定的相同曝光条件下对作为被检体的样品的一部分进行连续成像而获得的多个局部图像连接起来的多个部分图像而获得期望的整体图像的摄像装置的显微镜具备曝光条件运算装置。运算部基于通过驱动载置有被检体的检体台的检体台,在规定期间内对被检体进行检体的同时对被检体进行扫描而得到的流动图像之间的关系,对规定的相同曝光条件进行算术运算。和规定的期限。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009008793A

    专利类型

  • 公开/公告日2009-01-15

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20070168754

  • 发明设计人 NODA TOMOYA;

    申请日2007-06-27

  • 分类号G02B21/36;H04N5/225;H04N5/235;G06T1/00;G03B7/08;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:40

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