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FLAW SORTING APPARATUS, FLAW SORTING METHOD AND PROGRAM

机译:跳选装置,跳选方法和程序

摘要

PROBLEM TO BE SOLVED: To provide a flaw sorting apparatus that enhances the sorting capacity of a flaw regardless of an increase in the number of image feature quantities, a flaw sorting method and a program.;SOLUTION: The flaw sorting apparatus is equipped with an image processing part 26 for extracting image feature quantities from the image data of an inspection target acquired from a visual examination device 15 and a multivariate analysis processing part 28 for calculating a contribution ratio by performing a main component analyzing method or method of partial least squares with respect to the image feature quantities of the inspection target extracted in the image processing part to extract the image feature quantities of high contribution ratio and to determine the kind of the flaw from the extracted image feature quantities. Since the image feature quantities reaching a high contribution ratio becomes the same in the case of the same kind of the flaw, the sorting of the flaw can be performed from a combination of the extracted image feature quantities.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种不增加图像特征量的数量而提高缺陷分类能力的缺陷分类装置,缺陷分类方法和程序。图像处理部分26用于从从目视检查装置15获取的检查目标的图像数据中提取图像特征量,多元分析处理部分28用于通过执行主成分分析方法或偏最小二乘法来计算贡献率。相对于在图像处理部分中提取的检查目标的图像特征量,提取贡献率高的图像特征量,并从提取的图像特征量中确定缺陷的种类。由于在相同类型的缺陷情况下达到高贡献率的图像特征量变得相同,因此可以根据提取的图像特征量的组合来进行缺陷的分类。;版权所有:(C)2009,日本特许厅

著录项

  • 公开/公告号JP2009068946A

    专利类型

  • 公开/公告日2009-04-02

    原文格式PDF

  • 申请/专利权人 OMRON CORP;

    申请/专利号JP20070236590

  • 发明设计人 OBAYASHI SHIGERU;

    申请日2007-09-12

  • 分类号G01N21/956;H01L21/02;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:25

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