首页> 外国专利> STRAIGHTNESS MEASURING APPARATUS, THICKNESS FLUCTUATION MEASURING APPARATUS, AND ORTHOGONALITY MEASURING APPARATUS

STRAIGHTNESS MEASURING APPARATUS, THICKNESS FLUCTUATION MEASURING APPARATUS, AND ORTHOGONALITY MEASURING APPARATUS

机译:直线度测量仪,厚度波动测量仪和正交度测量仪

摘要

PROBLEM TO BE SOLVED: To allow high-precision straightness measurement which does not require an auto collimator, a standard square, or a plurality of displacement detectors for correcting a movement error of a linear movement mechanism, does not require the separate installation of a displacement measuring apparatus for position detection in a stage movement direction, and has a simple, compact structure.;SOLUTION: The straightness measuring apparatus installs a displacement detector 32 for measuring relative displacement with respect to an object under measurement 8 in the linear movement mechanism 12 and measures the relative displacement with respect to the object under measurement while moving the displacement detector 32 in the direction perpendicular to the measurement direction of the displacement detector. The apparatus is provided with a two-dimensional displacement detector 72 which can collectively measure the amount of movement of the linear movement mechanism in the travel direction and the amount of movement of the linear movement mechanism displaced in the straightness direction of the object under measurement which occurs concurrently.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:不需要使用自动准直仪,标准正方形或多个用于校正线性运动机构运动误差的位移检测器的高精度直线度测量,就不需要单独安装位移用于在台移动方向上进行位置检测的测量设备,并且具有简单,紧凑的结构。解决方案:直线度测量设备在线性移动机构12中安装了位移检测器32,用于测量相对于被测物体的相对位移8。在沿垂直于位移检测器的测量方向的方向移动位移检测器32的同时,测量相对于被测物体的相对位移。该装置设置有二维位移检测器72,该二维位移检测器72可以共同测量线性移动机构在行进方向上的移动量和线性移动机构在被测物体的笔直方向上移动的移动量,该二维移动量检测器72并发。;版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009068957A

    专利类型

  • 公开/公告日2009-04-02

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20070236839

  • 发明设计人 SAKAGAMI SEIJI;MORI YOUTOKU;

    申请日2007-09-12

  • 分类号G01B11/30;G01B11/02;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:24

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