In the generator of test pattern and the strobe signal and the interposition mannered null semiconductor test system

摘要

PROBLEM TO BE SOLVED: To provide a device and a method for inserting an additional delay time to the timing data of a specific event in an event type semiconductor test system for testing an electronic device to be tested by generating events of various timing.;SOLUTION: This delay time inserting device comprises an event memory for storing the timing data and event type data of each event and a means for inserting the delay time into the timing data of the specified event. An event having the total delay time by far longer than the time length capable of being expressed by the allocated number of data bits can be generated by inserting the delay time into the timing data of the specified event. The inserting means can insert the delay time by repeating the specified timing data and event type data for the event directly before the specified event.;COPYRIGHT: (C)2001,JPO