首页> 外国专利> Accurate mass measurement method of ion mass spectrometer and ion trap / time-of-flight

Accurate mass measurement method of ion mass spectrometer and ion trap / time-of-flight

机译:离子质谱仪和离子阱/飞行时间的精确质量测量方法

摘要

PROBLEM TO BE SOLVED: To provide an ion trap/time-of-flight mass spectrometer capable of precise mass measurement of product ions in MS/MS and MSn in addition.;SOLUTION: Using the ion trap/time-of-flight mass spectrometer equipped with an ion source for ionizing a testpiece, an ion trap capable of temporarily trapping ions, and a time-of-flight mass spectrometer; ions of a testpiece being a measuring object and a standard substance having an already-known mass number are generated with the ion source. From among the ions of the testpiece as a measuring object, precursor ions are selected, and product ions are generated by exciting and cleaving the precursor ions in the ion trap. After that, the ions of the standard substance are led into the ion trap and trapped, the product ions and the ions of the standard substance having been trapped are ejected from the ion trap and led into the time-of-flight mass spectrometer, to obtain mass spectra.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种离子阱/飞行时间质谱仪,此外还可以精确测量MS / MS和MS n 中产物离子的质量。 /飞行时间质谱仪,其具有用于使测试件电离的离子源,能够暂时捕获离子的离子阱和飞行时间质谱仪;用离子源产生作为测量对象的测试件的离子和具有已知质量数的标准物质。从测试体的作为测量对象的离子中选择前体离子,并通过激发和裂解离子阱中的前体离子来生成产物离子。然后,将标准物质的离子导入离子阱并进行捕集,将产品离子和已被捕集的标准物质的离子从离子阱中排出,并导入飞行时间质谱仪中。获得质谱图;版权所有:(C)2006,日本特许厅

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号