CONTROL VOLTAGE DETERMINING METHOD OF INTEGRATED CIRCUIT, GATE VOLTAGE DETERMINING METHOD OF TEG CIRCUIT, TEG CIRCUIT TESTING METHOD AND TESTING DEVICE

摘要

PPROBLEM TO BE SOLVED: To provide an integrated circuit and a TEG (Test Element Group) circuit hard to be affected by the impact on circuit operation caused by property variation or fluctuation of a transistor such as a threshold voltage. PSOLUTION: A current mode operation circuit comprises a pair of resistor devices MP1 and MP2, a pair of N type differential transistors MN1 and MN2, and a current source transistor ML for supplying operation current to the pair of N type differential transistors. The control voltage VL of the current flowing to the current source transistor is determined so that the voltage gain of the integrated circuit will become at least one or more, in relation to property variations such as the threshold voltage of the N type differential transistors. PCOPYRIGHT: (C)2009,JPO&INPIT